纳米技术
工作流程
软物质
埃
工程物理
计算机科学
材料科学
数据科学
物理
工程类
化学
化学工程
结晶学
数据库
胶体
作者
Linda E. Franken,Kay Grünewald,Egbert J. Boekema,Marc C. A. Stuart
出处
期刊:Small
[Wiley]
日期:2020-03-04
卷期号:16 (14): e1906198-e1906198
被引量:118
标识
DOI:10.1002/smll.201906198
摘要
Abstract With a significant role in material sciences, physics, (soft matter) chemistry, and biology, the transmission electron microscope is one of the most widely applied structural analysis tool to date. It has the power to visualize almost everything from the micrometer to the angstrom scale. Technical developments keep opening doors to new fields of research by improving aspects such as sample preservation, detector performance, computational power, and workflow automation. For more than half a century, and continuing into the future, electron microscopy has been, and is, a cornerstone methodology in science. Herein, the technical considerations of imaging with electrons in terms of optics, technology, samples and processing, and targeted soft materials are summarized. Furthermore, recent advances and their potential for application to soft matter chemistry are highlighted.
科研通智能强力驱动
Strongly Powered by AbleSci AI