折射率
材料科学
薄膜
光电子学
硅
多孔性
多孔硅
光学
纳米技术
复合材料
物理
作者
Nils Christian Keppler,Karen D. J. Hindricks,Peter Behrens
出处
期刊:RSC Advances
[Royal Society of Chemistry]
日期:2022-01-01
卷期号:12 (10): 5807-5815
被引量:45
摘要
The refractive index (RI) of ZIF-8 thin films with optical quality was determined over the whole visible spectrum. The RI can be fine-tuned over a wide range by loading with different organic guest molecules for various optical applications.
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