Influence of trapping and de-trapping charge in MOS-like structures with single and twofold SiOx films as active layers
作者
José Alberto Luna López,J.A. Luna López,D. E. Vázquez Valerdi,G. Garcı́a-Salgado,A. D. Hernández de la Luz,J. Carrillo López,J. Carrillo López,F.G. Nieto-Caballero,Miguel A. Domínguez