The Influence of Grain Size Determination Method on Grain Growth Kinetics Analysis

The full‐width at half‐maximum (FWHM), integral width (IntW), and Scherrer methodologies were used jointly with X‐ray diffraction (XRD) peak broadening and transmission electron microscopy (TEM) data to provide insight into the mechanisms that govern grain growth behavior in an Al 5083‐B 4 C nanocomposite. Grain growth kinetics were studied by fitting the appropriate grain size data from the three XRD‐based methods to the well‐known Burke equation. Variations observed in the absolute grain sizes calculated from different methods were in agreement with previous studies. In spite of these variations, consistent grain growth trends were observed, which resulted in relatively similar Arrhenius plots indicating two grain growth regimes. Consequently, the applicability as well as any relevant uncertainties within each method are described and discussed.