Ageing metallized polypropylene film capacitors laws confronted with the phenomenon of corrosion

Metallized polypropylene film capacitors are known to be one of the most common causes of failure in electronic systems. Predicting their lifetime to anticipate failures is a key issue in the assessment of these systems' reliability. In this paper, accelerated ageing tests applying voltage, temperature and humidity were conducted on 42 capacitors. The aim is to evaluate and sharpen the existing laws in literature thanks to the support of these data. Therefore, based on an analysis of failures and the understanding of this phenomenon, a new law is introduced modelling the capacitance degradation. The model has been assessed against the data, as compared to present laws in literature and other functions, describing the evolution of experimental curves.