静态随机存取存储器
微控制器
PMOS逻辑
计算机科学
电气工程
睡眠模式
泄漏(经济)
嵌入式系统
电压
计算机硬件
功率(物理)
工程类
物理
晶体管
功率消耗
经济
宏观经济学
量子力学
作者
Adrian Kneip,David Bol
出处
期刊:IEEE Transactions on Circuits and Systems I-regular Papers
[Institute of Electrical and Electronics Engineers]
日期:2023-01-02
卷期号:70 (3): 1311-1323
被引量:4
标识
DOI:10.1109/tcsi.2022.3230984
摘要
This work presents a 16kB ultra-low power (ULP)SRAM macro in 28nm FD-SOI with high energy efficiency in active mode and ultra-low leakage (ULL) in sleep mode, embedded in the SleepRider micro-controller unit (MCU) intended for IoT edge applications. The proposed SRAM integrates custom 7T ULL bitcells based on negative differential resistance (NDR) structures and a pMOS-only write port, achieving 2.1x lower area than previous NDR-based bitcells. A dual-supply strategy combined with negative-wordline write-assist concurrently provides worst-case data retention and correct write operations, up to the 64-MHz MCU target frequency. The SRAM macro periphery combines several low-power techniques to extract the full potential of the novel 7T bitcells, reaching an unprecedented speed-energy-leakage optimum with only 2.5% area overhead. Adaptive forward body biasing (FBB) further improves active mode performance while ensuring robustness against PVT variations. Measurement results showcase a minimum energy point of 0.78pJ per 32b access (assuming 50% read/write) at 0.5V and 64MHz. Moreover, leakage power drops from 296nW/kB at 0.5V in idle conditions to 0.23nW/kB in sleep at the 0.46V data retention voltage (DRV), yielding more than 1000x leakage reduction. As such, the proposed SRAM achieves an excellent trade-off between area, leakage and energy in the 10-to-100MHz frequency range.
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