缩进
开源
航程(航空)
计算机科学
样品(材料)
Java
变形(气象学)
软件
接触力
材料科学
机械
物理
复合材料
操作系统
经典力学
热力学
作者
Paweł Hermanowicz,Michał Sarna,Květoslava Burda,Halina Gabryś
摘要
We present an open source Java application for analysis of force curves and images recorded with the Atomic Force Microscope. AtomicJ supports a wide range of contact mechanics models and implements procedures that reduce the influence of deviations from the contact model. It generates maps of mechanical properties, including maps of Young's modulus, adhesion force, and sample height. It can also calculate stacks, which reveal how sample's response to deformation changes with indentation depth. AtomicJ analyzes force curves concurrently on multiple threads, which allows for high speed of analysis. It runs on all popular operating systems, including Windows, Linux, and Macintosh.
科研通智能强力驱动
Strongly Powered by AbleSci AI