护盾
电磁屏蔽
微电子
护盾
材料科学
通信卫星
屏蔽电缆
卫星
核工程
机械工程
电气工程
工程类
复合材料
光电子学
航空航天工程
地质学
岩石学
作者
Wesley C. Fan,Clifton Russell Drumm,S.B. Roeske,G.J. Scrivner
摘要
Shielding for space microelectronics needs to provide an acceptable dose rate with minimum shield mass.The analysis presented here shows that the best approach is, in general, to use a graded-Z shield, with a high-Z layer sandwiched between two low-Z materials.A graded-Z shield is shown to reduce the electron dose rate by more than sixty percent over a single-material shield of the same areal density.For protons, the optimal shield would consist of a single, low-Z material owever, it is shown that a graded-Z shield is nearly as effective as a single-material shield, as long as a low-Z layer is located adjacent to the microelectronics.A specific shield design depends upon the details of the radiation environment, system model, design margins/levels, compatibility of shield materials, etc.Therefore, we present here general principles for designing effective shields and describe how the computer codes are used for this application.
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