材料科学
电子显微镜
扫描共焦电子显微镜
显微镜
分辨率(逻辑)
常规透射电子显微镜
高分辨率
扫描透射电子显微镜
纳米技术
能量过滤透射电子显微镜
光学
扫描离子电导显微镜
显微镜
超分辨率
超分辨显微术
物理
计算机科学
人工智能
作者
J. C. H. Spence,Albert V. Crewe
出处
期刊:Physics Today
[AIP Publishing]
日期:1981-09-01
卷期号:34 (9): 90-90
被引量:716
摘要
The new edition of this practical microscopy guide includes additional material on high-resolution images of periodic structures and associated techniques. It provides both a view of the fundamental principles of electron microscopy and detailed practical information needed to record the images. Various theoretical results are summarized and practical examples given. A considerable fraction of the book has also been set aside for practical information on setting up and using an electron microscope. Applications in materials science, mineralogy, the biology of radiation-sensitive specimens, semiconductor physics and solid-state chemistry are all described for research workers in these fields.
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