Low-loss edge coupler for thin-film lithium niobate based on wafer-scale photolithography

A low-loss LNOI edge coupler fabricated on 4-inch wafer with deep ultraviolet lithography was demonstrated. The coupler was fabricated on LNOI with 600 nm thin-film lithium-niobate by 180nm lithography and ICP etch process. The 600nm thin-film lithium-niobate was etched for three times to achieve the coupler with tri-layer structure and narrow taper tips of below 150 nm. The fiber to chip coupling loss is 0.84 dB and 1.3 dB per facet for TE light at 1550 nm, when coupled with lensed fibers, which have 4 μm and 3.5 μm mode field diameter, respectively. Furthermore, the coupling loss is less than 1 dB per facet in the wavelength range between 1520 to 1560 nm.