Mask-Shifting-Based Projection Lithography for Microlens Array Fabrication

Microlens arrays play a critical role in enhancing imaging systems due to their outstanding optical performance, compact size, and lightweight nature. However, traditional fabrication methods for microlens arrays suffer from low precision, inefficiency, high costs, and a lack of adequate surface figure control. In this paper, we present a novel approach for microlens array fabrication, using a projection lithography process with mask-shifting. The method employs a 0.2× projection objective lens to enhance linewidth resolution. By employing a projection-based mask-shift filtering technique, we achieve superior surface figure accuracy while reducing the complexity of mask preparation. The experimental results for four microlenses with different aperture sizes demonstrate surface figure accuracy in the submicron range and surface roughness at the nanometer level. In addition, 3D profilometer scanning equipment was employed to measure the surface roughness of these microlens arrays, and the measurement results of these microlens arrays processed using the proposed method for their surface roughness are 18.4 nm, 29.6 nm, 34.4 nm, and 56.1 nm. Our findings indicate that this method holds great potential in microlens array fabrication, offering the ability to achieve lower linewidths and higher surface figure accuracy compared to conventional methods.