计算机科学
考试(生物学)
领域(数学)
地质学
数学
古生物学
纯数学
作者
Hao-Tien Cheng,Taixian Zhan,Yun-Cheng Yan,Te‐Hua Liu,Chao‐Hsin Wu
标识
DOI:10.1109/cleo-pr62338.2022.10432261
摘要
Investigation on the failure mechanisms of 850 nm vertical-cavity surface-emitting laser (VCSEL) chips in the high-temperature operating life (HTOL) stress tests are presented. Selected failed chips are put into further analysis to study their early failure mechanisms. © 2022 The Author(s)
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