JFET公司
逻辑门
逆变器
碳化硅
晶体管
材料科学
电气工程
场效应晶体管
光电子学
电压
电子工程
工程类
冶金
作者
Mitsuaki Kaneko,Masashi Nakajima,Qimin Jin,Tsunenobu Kimoto
标识
DOI:10.1109/led.2022.3179129
摘要
Here, we show that silicon carbide (SiC) complementary logic gates composed of p- and n-channel junction field-effect transistors (JFETs) fabricated by ion implantation operate at 623 K with a supply voltage as low as 1.4 V. The logic threshold voltage shift of the complementary JFET (CJFET) inverter is only 0.2 V from 300 to 623 K. Furthermore, temperature dependencies of the static and dynamic characteristics of the CJFET inverter are well explained by a simple analytical model of SiC JFETs.
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