材料科学
复合材料
介电强度
聚丙烯
极限抗拉强度
下降(电信)
结晶度
扫描电子显微镜
聚合物
电介质
电气故障
空化
拉伤
击穿电压
电阻率和电导率
电击穿
介电损耗
电植树
变形(气象学)
拉伸试验
作者
Kangning Wu,Haoran Sui,Qi Qi,Zichao Yang,Peng Zhao,Yawei Qin,Kai Yang,Benhong Ouyang,Shengtao Li,Jianying Li
出处
期刊:Nano Letters
[American Chemical Society]
日期:2025-10-31
卷期号:25 (45): 16270-16277
被引量:19
标识
DOI:10.1021/acs.nanolett.5c04644
摘要
It is commonly acknowledged that the electrical properties of polymer dielectrics remain stable before yielding. However, in this Letter, an abrupt 17.4% decline in the electrical breakdown strength was observed at 4% tensile strain in polypropylene (PP) insulation, which is far below its yielding strain (ε y, 16%). In situ scanning electron microscopy was conducted, and microvoids were unexpectedly found, forming at 4% strain, which is inconsistent with the understanding that cavitation only happens near ε y . The microvoids lead to higher free volume, increased carrier mobility, and the abrupt decline in the breakdown strength. Furthermore, such critical strain was identified as the elastic limit strain (ε e, 3.5%). On that basis, PP samples with suppressed yields and higher ε e (5.4%) were prepared with more elastomers. Only a 5.1% decrease in the breakdown strength was observed at 6% strain. This work reveals that suppressing yield and increasing ε e can improve the electrical performance stability of semicrystalline dielectrics under mechanical stress.
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