光学
分束器
光学工程
制作
物理
偏转(物理)
极限(数学)
梁(结构)
微秒
数字微镜装置
光纤
材料科学
光学滤波器
光束
图像分辨率
光电子学
计算机科学
三维光学数据存储
光开关
光学仪器
光学成像
高分辨率
光通信
光学现象
帧(网络)
分辨率(逻辑)
作者
Christopher Warkentin,Harishankar Jayakumar,Deano M. Farinella,Zachary Newman,Samuel Stanek,Runze Liu,Alishan Amirali,Aaron Kerlin
出处
期刊:Optica
[Optica Publishing Group]
日期:2026-04-23
卷期号:13 (5): 940-940
被引量:2
标识
DOI:10.1364/optica.579474
摘要
Laser scanning underpins many modern sensing, processing, and fabrication technologies. Typically, the speed of a deflector is constrained by its optical invariant and, therefore, the number of resolvable spots it can address. Some passive optical systems have been developed that can double the optical invariant of a single deflector. We propose a method to push this limit beyond 2× by relaying the deflected beam onto the deflector within an optical loop. We apply this relayed-loop optically amplified deflection (ReLOAD) method to achieve 8× amplification of electro-optical (EO) deflection, a technology with unparalleled speed, but limited optical invariant. With EO-ReLOAD, we demonstrate two-photon imaging at a 10 kHz frame rate, 1 MHz line scan rate, and µs step times across an addressable space well beyond the capabilities of typical EO deflectors. This technology overcomes the speed versus resolution trade-off, enabling a new class of deflectors for probing phenomena on microsecond timescales.
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