材料科学
表面等离子体激元
等离子体子
极化子
表面等离子体子
光电子学
金属绝缘体金属
金属
局域表面等离子体子
联轴节(管道)
凝聚态物理
太赫兹辐射
绝缘体(电)
电介质
光学
薄膜
作者
Georges Raşeev,Moustafa Achlan
标识
DOI:10.1088/1361-6463/abb103
摘要
An theoretical study is presented of the dispersion of surface plasmon polariton (SPP) and wave guide (WG) modes of a metal-insulator-metal (MIM) thin film stack. We study the dispersion of the reflectance and of the transmitted flux, originating from a local excitation source, of an asymmetric MIM air-Au-SiO 2-Au-Ti-glass material system in the infrared and visible spectral region for a wide range of SiO 2 and gold thicknesses, d SiO2 and d Au. In comparison to reference stacks of air-Au-glass or air-SiO 2-glass, between 1.4 and 2.0 eV, the transmitted flux intensity is enhanced 12 or 25 times, in the emission direction of the in-plane wave vector k ρ {k 0 «1.05 and for a thickness of d SiO2 P[300-700] nm, respectively. This enhancement is attributed to the coupling, through the avoided crossings, between the SPP air and WG modes. As the fields of the SPP air and WG modes are located in different regions of space the enhancement is nearly independent of the number of nodes in the WG mode. In summary we have identified sets of parameters giving rise to the observables enhancement. Therefore the present MIM thin film stack is a simple and a versatile system for the use in applications.
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