薄膜
材料科学
光学
反射率
光强度
光电子学
强度(物理)
光记录
物理
纳米技术
作者
J. J. H. Reche,D.L. Pulfrey
摘要
Apparatus is described which allows the continuous automatic recording of the intensity of linearly polarized light reflected from a growing thin film. From these data the optical properties of the thin film can be determined.
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