硅
材料科学
蚀刻(微加工)
微电子机械系统
氢氧化铵
钝化
表面微加工
锌酸盐
兴奋剂
腐蚀坑密度
抛光
小丘
铝
化学工程
光电子学
制作
纳米技术
复合材料
冶金
无机化学
化学
锌
图层(电子)
替代医学
工程类
病理
医学
作者
Makarand Paranjape,A. Pandy,S. Brida,L. M. Landsberger,Mojtaba Kahrizi,M. Zen
出处
期刊:Journal of vacuum science & technology
[American Institute of Physics]
日期:2000-03-01
卷期号:18 (2): 738-742
被引量:18
摘要
Tetra-methyl ammonium-hydroxide (TMAH), is an anisotropic silicon etchant that is gaining considerable use in silicon micromachining due to its excellent silicon etch rate, etch selectivity to masking layers, degree of anisotropy, and relatively low toxicity. However, a shortcoming of TMAH is that it aggressively etches exposed aluminum layers. A dual-doped low concentration TMAH solution is presented, which incorporates a silicate additive for aluminum passivation and an oxidizer additive for improving etch rate and surface quality. Using etch and under-etch experiments, the dual-doped 5 wt % TMAH solution is shown to have characteristics comparable to those of high concentration TMAH solutions with the added benefit of improved etch rate, smoother etched surfaces, and selectivity to silicon over aluminum. Such an etchant can find effective use in batch fabrication and integration of microelectromechanical systems within the framework of standard foundry processes.
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