期刊:Applied Physics Letters [American Institute of Physics] 日期:1970-06-01卷期号:16 (11): 439-441被引量:89
标识
DOI:10.1063/1.1653058
摘要
Epitaxial layers of ZnO have been deposited by chemical vapor transport on single-crystal sapphire substrates. The ZnO layers have been deposited up to thicknesses of 100μ. X-ray analysis showed that the c axis of the ZnO could be made to lie parallel to the (0112)-oriented sapphire substrate. Resistivities were generally from 1 to 10 Ω-cm but could be significantly increased by diffusion of lithium or sodium.