凝聚态物理
超导电性
安德列夫反射
双层石墨烯
约瑟夫森效应
扫描隧道显微镜
量子隧道
石墨烯
反射对称性
电导
双层
物理
六边形晶格
对称(几何)
量子力学
化学
生物化学
几何学
数学
膜
反铁磁性
作者
Héctor Sainz-Cruz,Pierre A. Pantaleón,Võ Tiến Phong,Alejandro Jimeno‐Pozo,F. Guinea
标识
DOI:10.1103/physrevlett.131.016003
摘要
Junctions provide a wealth of information on the symmetry of the order parameter of superconductors. We analyze junctions between a scanning tunneling microscope (STM) tip and superconducting twisted bilayer graphene (TBG) and TBG Josephson junctions (JJs). We compare superconducting phases that are even or odd under valley exchange (s- or f-wave). The critical current in mixed (s and f) JJs strongly depends on the angle between the junction and the lattice. In STM-TBG junctions, due to Andreev reflection, the f-wave leads to a prominent peak in subgap conductance, as seen in experiments.
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