Lv3
230 积分 2024-06-02 加入
Degradation Analysis of 14 nm SOI FinFETs by Influence of Hot Carrier Injection and Self-Heating Synergistic Effects
1天前
已完结
The influence of total ionizing dose on the hot carrier injection of 22 nm bulk nFinFET
3天前
已完结
Simulations of single event effects in 6T2C-based ferroelectric non-volatile static random access memory
3天前
已完结
Latest Advancements in Credit Risk Assessment with Machine Learning and Deep Learning Techniques
18天前
已关闭
Bridging the health literacy gap through AI chatbot design: the impact of gender and doctor cues on chatbot trust and acceptance
23天前
已完结
Impact of 60Co-γ Irradiation Pre-treatment on Single-Event Burnout in N-Channel Power VDMOS Transistors
1个月前
已完结
Radiation Immune-Planar Two-Terminal Nanoscale Air Channel Devices toward Space Applications
1个月前
已完结
Low-power electronic technologies for harsh radiation environments
2个月前
已完结
Achieving Zero‐Temperature Coefficient Point Behavior by Defect Passivation for Temperature‐Immune Organic Field‐Effect Transistors
2个月前
已完结
Total Ionizing Dose Effects of 55-nm Silicon-Oxide-Nitride-Oxide-Silicon Charge Trapping Memory in Pulse and DC Modes
2个月前
已完结
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