Lv6
1936 积分 2023-10-19 加入
NBTI-Stress Induced Grain-Boundary Degradation in Low-Temperature Poly-Si Thin-Film Transistors
1个月前
已完结
Analysis of Negative Bias Temperature Instability Degradation in p-Type Low-Temperature Polycrystalline Silicon Thin-Film Transistors of Different Grain Sizes
1个月前
已完结
Negative Bias Temperature Instability in Low-Temperature Polycrystalline Silicon Thin-Film Transistors
1个月前
已完结
Abnormal Two-Stage Degradation on P-Type Low-Temperature Polycrystalline-Silicon Thin-Film Transistor Under Hot Carrier Conditions
2个月前
已完结
Suppression of leakage current of low-temperature polycrystalline silicon thin-film transistors by negative bias sweeping
2个月前
已完结
Analysis of Negative Bias Temperature Instability Degradation in p-Type Low-Temperature Polycrystalline Silicon Thin-Film Transistors of Different Grain Sizes
2个月前
已完结
Investigation of the instability of low-temperature poly-silicon thin film transistors under a negative bias temperature stress
2个月前
已完结
Improvement of flicker phenomenon at low frequencies in AMOLED displays by applying compensation scheme of variable reset voltage
2个月前
已完结
P‐6.1: Research on Screen Splitting of 8T1C Pixel Circuit
2个月前
已完结
皖公网安备34019202002308
