| 标题 |
ToF-SIMS and XPS coupled characterization of HgCdTe surface oxides for infrared detection applications |
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| DOI | |
| 其它 |
期刊:Journal of vacuum science and technology 作者:Steven Bel; Clément Lobre; Sarah Petit; M. Veillerot; Giacomo Badano; et al 出版日期:2025-07-01 |
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(2025-6-4)