| 标题 |
Enhancing Uniformity, Read Voltage Margin, and Retention in Three-Dimensional and Self-Rectifying Vertical Pt/Ta 2 O 5 /Al 2 O 3 /TiN Memristors |
| 网址 | |
| DOI | |
| 其它 |
期刊:ACS Applied Materials & Interfaces 作者:Tae Won Park; Jiwon Moon; Dong Hoon Shin; Hae Jin Kim; Seung Soo Kim; et al 出版日期:2024-11-12 |
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(2025-6-4)