| 标题 |
Investigation of sidewall damage induced by reactive ion etching on AlGaInP MESA for micro-LED application |
| 网址 | |
| DOI | |
| 其它 |
期刊:Journal of Luminescence 作者:Younes Boussadi; N. Rochat; Jean‐Paul Barnes; Badhise Ben Bakir; Philippe Ferrandis; et al 出版日期:2021-01-24 |
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(2025-6-4)