| 标题 |
HZO Scaling and Fatigue Recovery in FeFET with Low Voltage Operation: Evidence of Transition from Interface Degradation to Ferroelectric Fatigue |
| 网址 | |
| DOI | |
| 其它 |
期刊:2023 IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits) 作者:Zuocheng Cai; Kasidit Toprasertpong; Mitsuru Takenaka; Shinichi Takagi 出版日期:2023-07-25 |
| 求助人 | |
| 下载 | 该求助完结已超 24 小时,文件已从服务器自动删除,无法下载。 |
PDF的下载单位、IP信息已删除
(2025-6-4)