| 标题 |
Accelerated Degradation of SiO/NCM Cell Quick Rechargeability Due to Depth-of-Discharge Range Dependent Failure Induced Li Dendrite Formation |
| 网址 | |
| DOI | |
| 其它 |
期刊:Journal of The Electrochemical Society 作者:Tae Hyeon Kim; Sung Su Park; Min Su Kang; Ye Rin Kim; Ho Seok Park; et al 出版日期:2022-02-01 |
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(2025-6-4)