| 标题 |
Radical etching with an aperture plate: correlating F atom density and highly selective etching of poly-Si and Si3N4over SiO2 in CF4/O2/He plasma |
| 网址 | |
| DOI | |
| 其它 |
期刊:Plasma Sources Science and Technology 作者:Yong Cao; Yuan Gao; Chaowei Yuan; Lijun Sang; Bowen Liu; Zhongwei Liu 出版日期:2026 |
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(2025-6-4)