| 标题 |
[高分]
Practical guide for inelastic mean free paths, effective attenuation lengths, mean escape depths, and information depths in x-ray photoelectron spectroscopy |
| 网址 | |
| DOI | |
| 其它 |
期刊:Journal of vacuum science & technology 作者:C. J. Powell 出版日期:2020-02-20 |
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(2025-6-4)