| 标题 |
A machine learning surrogate model for time of flight diffraction measurements of rough defects |
| 网址 | |
| DOI | |
| 其它 |
期刊:NDT & E International 作者:Piero Paialunga; Fan Shi; Stewart G. Haslinger; Joseph Corcoran 出版日期:2024-06-01 |
| 求助人 | |
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(2025-6-4)