| 标题 |
Fundamental mechanisms during EUV exposure and crosslinking of model organometallic photoresists |
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| DOI | |
| 其它 |
期刊:Advances in Patterning Materials and Processes XLIII 作者:Ankur Agarwal; Arnaud Dauendorffer; Santu Nandi; Ihsan Simms; Ryan Burns; et al 出版日期:2026 |
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(2025-6-4)