| 标题 |
Physical origin of residual thermal stresses in a multilayer ceramic capacitor |
| 网址 | |
| DOI | |
| 其它 |
期刊:Journal of Applied Physics 作者:Hyunho Shin; Jong-Sung Park; Kug Sun Hong; Hyun Suk Jung; Jung-Kun Lee; et al 出版日期:2007-03-27 |
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(2025-6-4)