| 标题 |
Mueller matrix ellipsometry of waveplates for control of their properties and alignment |
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| DOI | |
| 其它 |
期刊:Journal of Vacuum Science & Technology B, Nanotechnology and Microelectronics: Materials, Processing, Measurement, and Phenomena 作者:Pierre Koleják; Daniel Vala; Kamil Postava; Pavlína Provazníková; Jaromír Pištora 出版日期:2019-12-18 |
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(2025-6-4)