| 标题 |
TEM investigation of the role of the polycrystalline-silicon film/substrate interface in high quality radio frequency silicon substrates |
| 网址 | |
| DOI | |
| 其它 |
期刊:Materials Characterization 作者:Lipeng Ding; Jean‐Pierre Raskin; Gunnar Lumbeeck; D. Schryvers; Hosni Idrissi 出版日期:2020-01-29 |
| 求助人 | |
| 下载 |
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(2025-6-4)