| 标题 |
Thermophysical Property Measurement of GaN-on-AlN Wafers for Next-Generation RF Device Technologies |
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| DOI | |
| 其它 |
期刊:ASME 2024 International Technical Conference and Exhibition on Packaging and Integration of Electronic and Photonic Microsystems 作者:Husam Walwil; Daniel C. Shoemaker; Yiwen Song; Kyuhwe Kang; Nathaniel S. McIlwaine; et al 出版日期:2024-11-14 |
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(2025-6-4)