| 标题 |
Measurement and Quantitative Analysis of Oxide Trap Evolution in Power SiC Devices |
| 网址 | |
| DOI | |
| 其它 |
期刊:IEEE Transactions on Power Electronics 作者:Jinglin Li; Aditya Shekhar; Filip Simjanoski; Willem D. van Driel; Guo Qi Zhang 出版日期:2026-11-01 |
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(2025-6-4)