| 标题 |
Correlation of recombination dynamics with structural defects in 4H–SiC epitaxial wafers revealed by TRPL |
| 网址 | |
| DOI | |
| 其它 |
期刊:Applied Physics Letters 作者:Po-Lin Sung; Jia-Ming Kang; Ling-Lun Yen; Shang-Lin Chung; Anton Visikovskiy; et al 出版日期:2026 |
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(2025-6-4)