| 标题 |
Data retention investigation in Al:HfO2-based resistive random access memory arrays by using high-temperature accelerated tests |
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| 其它 |
期刊:Journal of vacuum science and technology 作者:Eduardo Pérez; Mamathamba Kalishettyhalli Mahadevaiah; Cristian Zambelli; P. Olivo; Christian Wenger 出版日期:2019-01-01 |
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(2025-6-4)