| 标题 |
Estimation of power MOSFET junction temperature during avalanche mode: Experimental tests and modelling |
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| DOI | |
| 其它 |
期刊:Microelectronics and reliability 作者:T. Azoui; P. Tounsi; J. Dorkel; Jean-Michel Reynes; J. Massol; et al 出版日期:2013-09-01 |
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(2025-6-4)