| 标题 |
Single-Event Upset Monitor-Based Radiation-Hardened Latch for Multi-Node Upset |
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| 其它 |
期刊:IEEE Transactions on Circuits and Systems - II - Express Briefs 作者:Zhe-Yu Zhan; Hai-Nan Liu; Duoli Li; Q. Ma; Wen-Xin Zhao; et al 出版日期:2025-08-01 |
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(2025-6-4)