| 标题 |
Scaling Challenges for Advanced CMOS Devices |
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| DOI | |
| 其它 |
期刊:International Journal of High Speed Electronics and Systems 作者:Ajey P. Jacob; Ruilong Xie; Min Gyu Sung; Lars W. Liebmann; Rinus T. P. Lee; et al 出版日期:2017-02-17 |
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(2025-6-4)