| 标题 |
Atomic-scale scanning single-electron transistor microscopy for low-angle twisted two-dimensional heterostructures |
| 网址 | |
| DOI | |
| 其它 |
期刊:Current Opinion in Solid State and Materials Science 作者:Behnam Esmaeilzadeh; Hossein Chamkouri; Zubaida Rukhsana Usha; Syed Asad Maqbool; Muhammad Touqeer 出版日期:2026-03-21 |
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(2025-6-4)