| 标题 |
Ultrasensitive metal-organic cluster resist for patterning of single exposure high numerical aperture extreme ultraviolet lithography applications |
| 网址 | |
| DOI |
10.1117/1.jmm.21.4.044603
doi
|
| 其它 |
期刊:Journal of micro/nanopatterning, materials, and metrology 作者:Manvendra Singh Chauhan; Kumar Palit; Sumit Choudhary; Satinder K. Sharma; Kenneth E. Gonsalves 出版日期:2022-12-27 |
| 求助人 | |
| 下载 | 求助已完成,仅限求助人或该文件上传人下载。 |
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(2025-6-4)