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Passivation of Interface Defects in GaN-Based Metal–Insulator-Semiconductor Devices via In Situ Combined Plasma Pretreatments |
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期刊:ACS Applied Materials & Interfaces 作者:Xiaohong Zeng; Ying Wu; Jinteng Zhang; Shicheng Han; Shicheng Yang; et al 出版日期:2025-05-15 |
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(2025-6-4)