| 标题 |
Straightforward method for sidewall roughness measurements by AFM on ion beam etched slanted diffraction gratings and their topography development |
| 网址 | |
| DOI |
10.1117/12.3000170
doi
|
| 其它 |
期刊:Optical Architectures for Displays and Sensing in Augmented, Virtual, and Mixed Reality (AR, VR, MR) V 作者:Paulo Lima; Sebastien Pochon; David Pearson; Sung-Jin Cho 出版日期:2024-01-27 |
| 求助人 | |
| 下载 | 该求助完结已超 24 小时,文件已从服务器自动删除,无法下载。 |
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(2025-6-4)