| 标题 |
Crystal structure analysis of stacking faults through scanning transmission electron microscopy of β-Ga2O3 (001) layer grown via halide vapor phase epitaxy |
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| DOI | |
| 其它 |
期刊:Journal of vacuum science & technology 作者:Kenichi Ogawa; Kenji Kobayashi; Noriyuki Hasuike; Toshiyuki Isshiki 出版日期:2022-04-12 |
| 求助人 | |
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(2025-6-4)