| 标题 |
Stressor SiNx contact etch stop layer (CESL) technology and its application in nano-scale transistors |
| 网址 | |
| DOI | |
| 其它 |
期刊:Journal of Materials Science: Materials in Electronics 作者:Qiang Xu; Wenjuan Xiong; Guilei Wang; Tianchun Ye 出版日期:2020-05-22 |
| 求助人 | |
| 下载 |
PDF的下载单位、IP信息已删除
(2025-6-4)