| 标题 |
Examination of through-thickness/through-time phase evolution during an MOD-type REBCO precursor conversion using Raman microscopy |
| 网址 | |
| DOI | |
| 其它 |
期刊:Superconductor Science and Technology 作者:Z Chen; V A Maroni; D J Miller; X Li; M W Rupich; R Feenstra 出版日期:2010-07-03 |
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(2025-6-4)