| 标题 |
Experimental Determination of Interface Trap Density and Fixed Positive Oxide Charge in Commercial 4H-SiC Power MOSFETs |
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| DOI | |
| 其它 |
期刊:IEEE Access 作者:Susanna Yu; Marvin H. White; Anant Agarwal 出版日期:2021-01-01 |
| 求助人 | |
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(2025-6-4)