| 标题 |
A review of thermoreflectance techniques for characterizing wide bandgap semiconductors’ thermal properties and devices’ temperatures |
| 网址 | |
| DOI | |
| 其它 |
期刊:Journal of Applied Physics 作者:Chao Yuan; Riley Hanus; Samuel Graham 出版日期:2022-12-08 |
| 求助人 | |
| 下载 |
PDF的下载单位、IP信息已删除
(2025-6-4)